Online and Built-in Self-testing Techniques for Field Programmable Analog Array
Author | : Amit Laknaur |
Publisher | : |
Total Pages | : 220 |
Release | : 2010 |
ISBN-10 | : OCLC:730942730 |
ISBN-13 | : |
Rating | : 4/5 (30 Downloads) |
Book excerpt: This research develops a built-in self-testing (BIST) and online testing techniques for switched capacitor (SC) based Field Programmable Analog Arrays (FPAAs). Particularly, a BIST technique for programmable capacitor arrays (PCAs) is developed and its efficiency is analyzed. The proposed BIST technique results in very little hardware overhead and can be easily implemented on FPAAs. Techniques to model the impact of parametric faults on the performance of programmable capacitor arrays are also developed. Secondly, a comprehensive methodology is developed to perform online testing of SC based FPAA circuits. By taking advantage of the programmable resources, the proposed method can effectively test various sections of the FPAA circuits. Furthermore, a novel programmable analog comparator is developed whose error threshold can be adaptively adjusted according to its input signal levels. It is ideal for analog online testing applications for enhanced testing accuracy due to the fact that its programmability allows the end user to adapt the error threshold to the testing needs.