Built-in-self-testing Techniques for Programmable Capacitor Array
Author | : Amit Laknaur |
Publisher | : |
Total Pages | : 82 |
Release | : 2005 |
ISBN-10 | : OCLC:144351508 |
ISBN-13 | : |
Rating | : 4/5 (08 Downloads) |
Book excerpt: This thesis presents efficient built-in-self-testing (BIST) techniques for programmable capacitor arrays (PCAs) used in field programmable analog arrays (FPAAs). The proposed BIST circuits consist of switched-capacitor (SC) integrators and analog window comparators. By taking advantage of FPAA programmable resources, the BIST circuits introduce very small hardware overhead. With considering major circuit parasitics, closed-form equations are derived to predict the outputs of PCA BIST circuits and estimate the ranges of detectable parametric faults. Design techniques for analog window comparators are also studied in this paper and a new comparator circuit is presented. Impacts of comparator threshold variations on the design as well as the efficiency of the PCA BIST circuits are investigated. Techniques to reduce the effects of comparator threshold variations are presented. Finally, circuit simulations are performed to validate the proposed techniques.