Ionizing Radiation Effects in MOS Devices and Circuits
Download or Read eBook Ionizing Radiation Effects in MOS Devices and Circuits PDF written by T. P. Ma and published by John Wiley & Sons. This book was released on 1989-04-18 with total page 616 pages. Available in PDF, EPUB and Kindle.
| Author | : T. P. Ma |
| Publisher | : John Wiley & Sons |
| Total Pages | : 616 |
| Release | : 1989-04-18 |
| ISBN-10 | : 047184893X |
| ISBN-13 | : 9780471848936 |
| Rating | : 4/5 (3X Downloads) |
Book Synopsis Ionizing Radiation Effects in MOS Devices and Circuits by : T. P. Ma
Book excerpt: The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
