The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufact

Optical methods, stimulated by the advent of inexpensive and reliable lasers, are assuming an increasingly important role in the field of engineering metrology.

Since the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. Th

SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. *