As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability iss

Over the years, the fundamentals of VLSI technology have evolved to include a wide range of topics and a broad range of practices. To encompass such a vast amou